Microscopy Electron Microscopy
Scanning Electron Microscopy Laboratory for Geomaterials
Electron Probe Microanalyzer (EPMA)
JEOL SuperProbe JXA-iSP100
equipped with:
- Tungsten filament or LaB6
- 5 wavelength-dispersive crystal spectrometers:
One 4-crystal spectrometer:
TAP + LiF + LDE1 + LDEB
Four double-crystal type-L spectrometers:
LiFL + PETL
LiFL + PETL
TAPL + PETL
TAPL + PETL - Energy Dispersive Spectroscopy (EDS) system, 30 mm² detector (with live view)
- Cathodoluminescence detector
Schottky Emitter – Scanning Electron Microscope (FEG-SEM) with EBSD System
JEOL FEG-SEM JSM-IT800
equipped with:
- In-lens Schottky emitter (FEG)
- Electron Backscatter Diffraction (EBSD) detector (Oxford Instruments, Symmetry 2)
- Energy Dispersive Spectroscopy (EDS) system (Oxford Instruments, Ultim Max 100 mm²)
- High vacuum SE and 6-sector BSE detectors
- Low-vacuum system (with SE and BSE detectors)
- Eucentric 5-axes stage (x / y / z / tilt / rotate)
- Sample size up to 100*100*50 mm
Binocular Stemi 508
Laboratory for Scanning Electron Microscopy, Cathodoluminescence, and Micro-Raman
Correlative Raman Scanning Electron Microscope: ZEISS WITec RISE EVO MA15
with EDS detector: Oxford Instruments X-MaxN 150 mm²
and Cathodoluminescence detector: GATAN ChromaCL2
